Cirrus-logic CDB42L55 Manuel d'utilisateur télécharger pdf (Page 19)

DS773DB1 19

CDB42L55

6 PERFORMANCE PLOTS

Test conditions (unless otherwise specified): T

= 25°C; VA=VCP=VLDO=VL=1.8 V; input test signal is a full-scale

997 Hz sine wave; dB values relative to full-scale output; measurement bandwidth 20 Hz to 20 kHz (un-weighted);

sample frequency = 48 kHz; +2 dB analog gain for Line Output path; -4 dB analog gain for Headphone Output path;

headphone test load: R

= 16 Ω; no LPF option for Headphone Output path.

Note: The total harmonic distortion + noise (THD+N) performance of the ADC in the CS42L55 is determined

by the value of the capacitor on the FILT+ pin. Larger capacitor values yield significant improvement

in THD+N at low frequencies. Fig. 10 shows the THD+N vs. frequency performance measured with a

2.2 µF capacitor.

-100

-60

-95

-90

-85

-80

-75

-70

-65

20 20k50 100 200 500 1k 2k 5k 10k

-100

-60

-95

-90

-85

-80

-75

-70

-65

-60 -10-50 -40 -30 -20

dBr

Figure 10. THD+N vs Freq. - Analog In to Digital Out Figure 11. THD+N vs Amplitude - Analog In to Digital Out

-140

-120

-100

-80

-60

-40

-20

20 20k50 100 200 500 1k 2k 5k 10k

-140

-120

-100

-80

-60

-40

-20

20 20k50 100 200 500 1k 2k 5k 10k

Figure 12. FFT - Analog In to Digital Out @ -1 dBFS

Figure 13. FFT - Analog In to Digital Out @ -60 dBFS

1 2 ... 14 15 16 17 18 19 20 21 22 23 24 ... 35 36

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Cirrus-logic CDB42L55 Manuel d'utilisateur Page 19

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